Abstract
It has been demonstrated that the electro-optic sampling technique can be used to characterize electrical signals with rise times as short as .46 ps.1 In this report we show the application of this sampling technique to the measurement of the transient response of GaAs TEGFETs and MESFETs.
© 1985 Optical Society of America
PDF ArticleMore Like This
K. E. MEYER, D. R. DYKAAR, G. A. MOUROU, and U. ROCHESTER
TUK4 Conference on Lasers and Electro-Optics (CLEO:S&I) 1985
K.E. Meyer and G.A. Mourou
WB3 Picosecond Electronics and Optoelectronics (UEO) 1985
B.H. Kolner, K.J. Weingarten, and D.M. Bloom
WB4 Picosecond Electronics and Optoelectronics (UEO) 1985