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The use of FT Spectrometers in optical coating measurements

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Abstract

The Fourier Transform Spectrometer consists of a Michelson interferometer, a source and a detector. The sample is placed between the interferometer and detector. A mirror moving at constant speed creates an optical path difference. The measured signal is called the interferogram. After mathematical treatment, including the Fourier transform, the spectrum is retrieved. This spectrum contains information about the sample, but also on the instrumental response. This spectrum is usually ratioed to an open beam or background spectrum which eliminates the instrumental function. Such an instrument can be constructed for operation in any spectral region, but shorter wavelengths dictate more stringent requirements on the optical parts and motion accuracy. Evidently, suitable detectors and sources must be selected. High-end research grade instruments can be easily be re-configured for operation from 1000μm to 250nm.

© 1992 Optical Society of America

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