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Abstract
The (La, Sr)(Al, Ta)${{\rm{O}}_3}$ crystal was irradiated via 20.0 MeV C ion with fluence of ${1.0} \times {{1}}{{{0}}^{15}}\;{\rm{ions}}/{\rm{cm}}^2$. The Rutherford backscattering (RBS)/channeling spectra, the hardness and elastic modulus as continuous functions of the depth, and X-ray diffraction (XRD) are used to analyze the irradiation damage, hardness, and structural changes in the near-surface area of samples. Prism coupling and end-face coupling methods were used to study the changes of optical waveguide properties under different annealing conditions. Considering the potential applications of low-loss waveguide structure in photoelectric sensors, electrical properties of (La, Sr)(Al, Ta)${{\rm{O}}_3}$ samples were studied as an important detection indicator of sensors.
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