Abstract

This paper describes how to predict the refractive-index profile in a field assisted ion-exchange process. Since the dielectric constant varies during the ion exchange, the field correction has been considered using the Lorentz–Lorenz formula. The index profile of a planar microlens is simulated by numerically solving a drift–diffusion equation for dopant ions in a glass and the result agrees well with the measured one.

© 1989 Optical Society of America

Index profile of a planar microlens by ion exchange/diffusion

Xiao-Fan Zhu and Kenichi Iga
Appl. Opt. 25(19) 3397-3400 (1986)

Distributed-index formation process in a planar microlens

Masahiro Oikawa, Kenichi Iga, Motoyasu Morinaga, Tetsuo Usui, and Takashi Chiba
Appl. Opt. 23(11) 1787-1789 (1984)

Distributed-index planar microlens

M. Oikawa and K. Iga
Appl. Opt. 21(6) 1052-1056 (1982)

Distributed-index planar microlens and stacked planar optics: a review of progress

K. Iga and S. Misawa
Appl. Opt. 25(19) 3388-3396 (1986)

Ray traces in a distributed-index planar microlens

Kenichi Iga, Masahiro Oikawa, and Junichi Banno
Appl. Opt. 21(19) 3451-3455 (1982)