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Conferences > Sensors > 2016 > SeW3E > SeW3E.3

Sensitivity Enhancement of Silicon-wire based Surface Plasmon Interference through Surrounding Bimetallic Layers

Shih-Hsiang Hsu, Ying-Kai Liao, and Bo-Rui Liao

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Abstract

The silicon-wire, surrounded by bimetallic layers of silver and gold, demonstrates surface plasmon interference with TM/TE enhanced sensitivity of 2873-nm per refractive-index-unit, 6 times and 15% better than the top gold film and an additional silicon layer embedded in silicon, respectively.

© 2016 Optical Society of America

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