Photorefractive materials, effects and devices topical meeting Kiev -1993: Epitaxial Growth and Optical Properties of Bi12GeO20 SINGLE Cristalline Thin Films Deposited on (1102) Al2O2 Substrate by the Pulsed LASER Deposition (P.L.D) Technique

V. CHEVRIER; A. INAM; S. ETEMAD; D. HARRIS; J. C. LAUNAY; J. C. LAUNAY

doi:10.1364/PMED.1993.ThE.1

Photorefractive Materials, Effects And Devices Prm'93
Technical Digest Series (Optica Publishing Group, 1993),
paper ThE.1
•https://doi.org/10.1364/PMED.1993.ThE.1

Photorefractive materials, effects and devices topical meeting Kiev -1993: Epitaxial Growth and Optical Properties of Bi₁₂GeO₂₀ SINGLE Cristalline Thin Films Deposited on (1102) Al₂O₂ Substrate by the Pulsed LASER Deposition (P.L.D) Technique

V. CHEVRIER, A. INAM, S. ETEMAD, D. HARRIS, and J. C. LAUNAY

Photorefractive Materials, Effects, and Devices II 1993

Kiev Ukraine
11–15 August 1993
ISBN:

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Fabrication & Study of Photorefractive Waveguides (ThE)

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V. CHEVRIER, A. INAM, S. ETEMAD, D. HARRIS, and J. C. LAUNAY, "Photorefractive materials, effects and devices topical meeting Kiev -1993: Epitaxial Growth and Optical Properties of Bi12GeO20 SINGLE Cristalline Thin Films Deposited on (1102) Al2O2 Substrate by the Pulsed LASER Deposition (P.L.D) Technique," in Photorefractive Materials, Effects And Devices Prm'93, Technical Digest Series (Optica Publishing Group, 1993), paper ThE.1.

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Abstract

Photorefractive materials are of a significant interest for a variety of applications in optical signal processing.

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