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Conferences > OIC > 2007 > FA > FA10

X-Ray Diffraction Properties of Silica Thin Films Having Single Crystalline Mesoporous Structures

Takashi Noma, Hirokatsu Miyata, Kazuhiro Takada, and Atsuo Iida

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Abstract

Detailed X-ray diffraction study of silica films with single crystalline mesoporous structures shows that the behavior of X-rays in these mesoporous materials with nano-scaled structural regularity is quite identical to that in real crystals.

© 2007 Optical Society of America

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