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Polarization Mode Coupling and Emitted Optical Fields in Apertureless Scanning Near-field Optical Microscopy Probes

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Abstract

We investigate the effect of structured and quasi-random defects in the metal coating of apertureless microfabricated SNOM probes on polarization mode coupling in the probe and on the emitted optical fields using rigorous modeling tools.

© 2006 Optical Society of America

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