Analysis of polarization-dependent near-field optical effects in microfabricated apertureless SNOM probes

Wataru Nakagawa; Luciana Vaccaro; Emiliano Descrovi; Hans Peter Herzig

doi:10.1364/NPIS.2005.NThA6

Integrated Photonics Research and Applications/Nanophotonics for Information Systems
Technical Digest (Optica Publishing Group, 2005),
paper NThA6
•https://doi.org/10.1364/NPIS.2005.NThA6

Analysis of polarization-dependent near-field optical effects in microfabricated apertureless SNOM probes

Wataru Nakagawa, Luciana Vaccaro, Emiliano Descrovi, and Hans Peter Herzig

Nanophotonics for Information Systems 2005

San Diego, California United States
13–15 April 2005
ISBN: 1-55752-787-3

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Modeling and Design for Nanophotonics (NThA)

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W. Nakagawa, L. Vaccaro, E. Descrovi, and H. P. Herzig, "Analysis of polarization-dependent near-field optical effects in microfabricated apertureless SNOM probes," in Integrated Photonics Research and Applications/Nanophotonics for Information Systems, Technical Digest (Optica Publishing Group, 2005), paper NThA6.

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Abstract

We investigate the influence of single and multiple defects in the metal coating layer of microfabricated apertureless scanning near-field optical microscopy (SNOM) probes on the polarization-dependent emitted optical near field using rigorous electromagnetic modeling tools.

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