Three-Dimensional (3D) Model-Based Restoration for Structured Illumination Microscopy Based on a 3D Illumination Pattern

Cong T. S. Van; Chrysanthe Preza

doi:10.1364/3D.2021.3Th4D.1

OSA Imaging and Applied Optics Congress 2021 (3D, COSI, DH, ISA, pcAOP)
OSA Technical Digest (Optica Publishing Group, 2021),
paper 3Th4D.1
•https://doi.org/10.1364/3D.2021.3Th4D.1

Three-Dimensional (3D) Model-Based Restoration for Structured Illumination Microscopy Based on a 3D Illumination Pattern

Cong T. S. Van and Chrysanthe Preza

3D Image Acquisition and Display: Technology, Perception and Applications 2021

Washington, DC United States
19–23 July 2021
ISBN: 978-1-943580-89-7

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3D Sensing and Displays (3Th4D)

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C. T. S. Van and C. Preza, "Three-Dimensional (3D) Model-Based Restoration for Structured Illumination Microscopy Based on a 3D Illumination Pattern," in OSA Imaging and Applied Optics Congress 2021 (3D, COSI, DH, ISA, pcAOP), H. Hua, B. Javidi, M. Martinez-Corral, O. Matoba, A. Stern, S. Thibault, T. Alieva, J. Ke, F. Willomitzer, F. Okten, P. Silveira, P. Banerjee, E. Stoykova, D. Chu, J. Park, F. Imai, C. Joo, M. Digman, D. Gardner, S. Gladysz, D. LeMaster, S. Basu, and O. Korotkova, eds., OSA Technical Digest (Optica Publishing Group, 2021), paper 3Th4D.1.

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Abstract

We extend our previously developed 3D iterative model-based approach for 3D structured illumination microscopy to include a positivity constraint. We show using noisy simulations that it can provide improved restorations and 3D super resolution.

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