3D structured illumination microscopy with unknown patterns and a statistical prior

Li-Hao Yeh; Nicole A Repina; Laura Waller

doi:10.1364/3D.2017.DW2F.3

Imaging and Applied Optics 2017 (3D, AIO, COSI, IS, MATH, pcAOP)
OSA Technical Digest (online) (Optica Publishing Group, 2017),
paper DW2F.3
•https://doi.org/10.1364/3D.2017.DW2F.3

3D structured illumination microscopy with unknown patterns and a statistical prior

Li-Hao Yeh, Nicole A Repina, and Laura Waller

3D Image Acquisition and Display: Technology, Perception and Applications 2017

San Francisco, California United States
26–29 June 2017
ISBN: 978-1-943580-29-3

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L. Yeh, N. A. Repina, and L. Waller, "3D structured illumination microscopy with unknown patterns and a statistical prior," in Imaging and Applied Optics 2017 (3D, AIO, COSI, IS, MATH, pcAOP), OSA Technical Digest (online) (Optica Publishing Group, 2017), paper DW2F.3.

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Abstract

We demonstrate resolution enhancement in 3D by structured illumination microscopy (SIM) with unknown illumination patterns. Our algorithmic self-calibration algorithm recovers both the image and the patterns, given a statistical prior.

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