Abstract

The wavemeter is an important instrument for spectrum analysis, widely used in spectral calibration, remote sensing, atomic physics, and high-precision metrology. However, near-infrared (NIR) wavemeters require infrared-sensitive detectors that are expensive and less sensitive compared to silicon-based visible light detectors. To circumvent these limitations, we propose an NIR speckle wavemeter based on nonlinear frequency conversion. We combine a scattering medium and the deep learning technique to invert the nonlinear mapping of the NIR wavelength and speckles in the visible wave band. With the outstanding performance of deep learning, a high-precision wavelength resolution of 1 pm is achievable in our experiment. We further demonstrate the robustness of our system and show that the recognition of power parameters and multi-spectral lines is also feasible. The proposed method offers a convenient and flexible way to measure NIR light, and it offers the possibility of cost reduction in miniaturized wavemeter systems.

© 2023 Optica Publishing Group

Compact wavemeter incorporating femtosecond laser-induced surface nanostructures enabled by deep learning

Rui Cai, Yao Xiao, Xiaolin Sui, Yongyi Li, Ziyan Wu, Jie Wu, Guoliang Deng, Hao Zhou, and Shouhuan Zhou
Opt. Lett. 48(15) 3961-3964 (2023)

Rayleigh speckle-based wavemeter with high dynamic range and fast reference speckle establishment process assisted by optical frequency combs

Yangyang Wan, Xinyu Fan, Shuai Wang, Zhaopeng Zhang, Bingxin Xu, and Zuyuan He
Opt. Lett. 46(6) 1241-1244 (2021)

Overcoming the speckle correlation limit to achieve a fiber wavemeter with attometer resolution

Graham D. Bruce, Laura O’Donnell, Mingzhou Chen, and Kishan Dholakia
Opt. Lett. 44(6) 1367-1370 (2019)

Nonlinear optical bistability based on epsilon-near-zero mode in near-infrared band

Jiao Xu, Yuxiang Peng, Jie Jiang, Shengyou Qian, and Leyong Jiang
Opt. Lett. 48(12) 3235-3238 (2023)

Femtometer-resolved simultaneous measurement of multiple laser wavelengths in a speckle wavemeter

Graham D. Bruce, Laura O’Donnell, Mingzhou Chen, Morgan Facchin, and Kishan Dholakia
Opt. Lett. 45(7) 1926-1929 (2020)