Abstract
This paper briefly explains the algorithm proposed earlier for the nonlinear
processing of interferograms, making it possible to increase their sensitivity all
the way to the limiting value. It is shown that this algorithm can be adapted to
increase the sensitivity of the phase-contrast method and to process diffraction
patterns. Such processing allows the size of a microscopic object the illumination
of which produces a diffraction pattern to be determined with increased
accuracy.
© 2009 Optical Society of America
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