Abstract
In this study, single-phased rutile ${{\rm Ti}_{1 \text{-} x}}{{\rm In}_x}{{\rm O}_2}$ ($x = {0}\sim{0.1}$) thin films were deposited on fused quartz substrates using a pulsed laser deposition technique. The transmission spectra reveal that the films show good transparency in the wavelength range of 330–900 nm. The absorption edge of the ${{\rm Ti}_{1 \text{-} x}}{{\rm In}_x}{{\rm O}_2}$ thin films is blueshifted compared with that of undoped ${{\rm TiO}_2}$ films. A single-beam ${z}$-scan method using a pulse laser operating at 532 nm with a duration of 55 ps was employed to evaluate the films’ nonlinear optical characteristics. The results show that the prepared ${{\rm Ti}_{1 \text{-} x}}{{\rm In}_x}{{\rm O}_2}$ films exhibit nonlinear saturable absorption and negative nonlinear refraction properties. The doping of In ions into ${{\rm TiO}_2}$ does not change the nonlinear optical absorption significantly. However, the nonlinear refractive index of ${{\rm Ti}_{1 \text{-} x}}{{\rm In}_x}{{\rm O}_2}$ film obviously increases with the increasing doping of In ions. The local electron-pinned defect-dipoles and widening bandgaps in the ${{\rm Ti}_{1 \text{-} x}}{{\rm In}_x}{{\rm O}_2}$ thin films could be used to explain the observed results.
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