Abstract

We study the behavior of light waves at an interface between linear and photorefractive media, where the incident wave propagates from the linear side. We find bistable behavior of the reflection coefficient as a function of the incident angle at incident wave directions in the vicinity of the critical angle for total internal reflection. The analysis is based on approximations in the photorefractive-process equations, for which an analytical plane-wave solution for the boundary problem is found. In this regime an exponentially decaying evanescent field induces a uniform change of the refractive index. The limitation of this solution is also studied by a numerical analysis.

© 1994 Optical Society of America

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