Abstract

We describe a rapid testing system for active matrix thin-film transistor (TFT) backplanes which enables the identification of many common processing defects. The technique spatially maps the charge feedthrough from TFTs in the pixel and is suited for pixels with switched-capacitor architecture.

© 2009 IEEE

Ultra-high-image-density large-size organic light-emitting devices based on In-Ga-Zn-O thin-film transistors with a coplanar structure

Hong Jae Shin and Tae Whan Kim
Opt. Express 26(13) 16805-16812 (2018)

Reconfigurable intelligent optical backplane for parallel computing and communications

Ted H. Szymanski and H. Scott Hinton
Appl. Opt. 35(8) 1253-1268 (1996)

Rapid fabrication of large-area periodic structures containing well-defined defects by combining holography and mask techniques

Ngoc Diep Lai, Wen Ping Liang, Jian Hung Lin, and Chia Chen Hsu
Opt. Express 13(14) 5331-5337 (2005)

A flatbed scanner for large-area thickness determination of ultra-thin layers in printed electronics

Nils Bornemann and Edgar Dörsam
Opt. Express 21(19) 21897-21911 (2013)

The effect of periodicity on the defect modes of large mode area microstructured fibers

Joanne C. Flanagan, R. Amezcua, F. Poletti, J.R. Hayes, N.G.R. Broderick, and D. J. Richardson
Opt. Express 16(23) 18631-18645 (2008)