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OSA Publishing

10 July 2018, Volume 16, Issue 7, pp. 070201-073202   18 articles


Instrumentation, Measurement, and Metrology

Simultaneous 2D in-plane deformation measurement using electronic speckle pattern interferometry with double phase modulations

Chin. Opt. Lett. 16(7), 071201- (2018)  View: PDF

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