Abstract
We demonstrate a polarization insensitive arrayed-input spectrometer
using echelle diffraction grating (EDG) for hyperspectral imaging. The EDG
consists of 65 input waveguides and 129 output waveguides, allowing
spectral measurements of 65 image pixels at a time when used in
combination with a micro-electromechanical system micro mirror array. The
spectral resolution reaches 7.8 nm for wavelengths ranging from 1250 to
1700 nm. The measured loss is −2 dB, and the crosstalk is lower than −20
dB. The 3 μm silicon-on-insulator platform provides the device with
polarization insensitive characteristics. The chip size is only 6 mm×10
mm.
© 2017 Chinese Laser Press
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