Abstract

The x-ray spectrum resulting from beta decay of an erbium tritide film is used to measure tritium content of the film. The areal density of the film is measured using differential emission techniques and is used to correct the measured x-ray intensity for self-absorption. The corrected intensity is linearly related to tritium content through an empirically derived calibration curve. The technique will measure tritium contents from less than one to several hundred micron liters. Repeatability is generally determined by counting errors and is typically 0.3% for a 5-min count while accuracy depends upon the empirical calibration technique. In principle, the technique is not limited to erbium tritide but can be extended to many uniformly radiating thin films.

Optical emission spectrum of tritium gas

Robert W. Schmieder
J. Opt. Soc. Am. 72(5) 593-600 (1982)

Determination of optical constants of thin films in the EUV

Richard Ciesielski, Qais Saadeh, Vicky Philipsen, Karl Opsomer, Jean-Philippe Soulié, Meiyi Wu, Philipp Naujok, Robbert W. E. van de Kruijs, Christophe Detavernier, Michael Kolbe, Frank Scholze, and Victor Soltwisch
Appl. Opt. 61(8) 2060-2078 (2022)

Study of photoinduced birefringence vs As content in thin GeAsS films

K. Palanjyan, S. H. Messaddeq, Y. Messaddeq, R. Vallée, E. Knystautas, and T. Galstian
Opt. Mater. Express 3(6) 671-683 (2013)

Influence of aluminum content on plasmonic behavior of Mg-Al alloy thin films

Kanagasundar Appusamy, Mark Swartz, Steve Blair, Ajay Nahata, Jennifer S. Shumaker-Parry, and Sivaraman Guruswamy
Opt. Mater. Express 6(10) 3180-3192 (2016)

Optical constant determination of thin films

Mool C. Gupta
Appl. Opt. 27(5) 954-956 (1988)