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Increase in Exciton Radiative Lifetime in GaAs Quantum Wells at High Exciton Density due to Exciton-Exciton Scattering

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Abstract

We report time-resolved photoluminescence (TRPL) measurements of the radiative lifetime (τr) at 1.8K of resonantly excited heavy-hole excitons in a 27nm GaAs single quantum well as a function of exciton density. By the use of AlAs interface smoothing layers [1], the sample exhibits very little inhomogeneous broadening (≈0.15meV). The exciton centre of mass motion is therefore not significantly restricted by localisation in well width fluctuation islands. However, measurements of the exciton homogeneous linewidth (Γh) using time-resolved degenerate four wave mixing in the self-diffraction configuration (Fig.1) [2], additionally show that the sample imperfection scattering contribution to the Γh of these delocalised excitons is also small (0.2meV). Thus, as indicated by the dependence of Γh on exciton density (Nx), even at moderate exciton densities, exciton-exciton scattering is the dominant dephasing interaction within the photocreated exciton ensemble.

© 1992 The Author(s)

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