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Experiments of Noncontact Nano-displacement Sensing by Alternating Quadrature Phase Modulated Reference Light

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Abstract

The use of quadrature phase modulated reference light simplified optical noncontact nanometer displacement measurements and provided 99.9% of measurement linearity from few nanometers to almost one hundred nanometers with a resolution of approximately 0.36nm.

© 2023 The Author(s)

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