"Ultrasonic Measurements of Surface Roughness"

G.V. Blessing; J.C. Boudreaux; D.G. Eitzen; J.A. Slotwinski

doi:10.1364/SURS.1992.STuB1

Surface Roughness and Scattering
Technical Digest Series (Optica Publishing Group, 1992),
paper STuB1
•https://doi.org/10.1364/SURS.1992.STuB1

"Ultrasonic Measurements of Surface Roughness"

G.V. Blessing, J.C. Boudreaux, D.G. Eitzen, and J.A. Slotwinski

Surface Roughness and Scattering 1992

Tucson, Arizona United States
1–3 June 1992
ISBN:

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Instrumentation (STuB)

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G. V. Blessing, J. C. Boudreaux, D. G. Eitzen, and J. A. Slotwinski, ""Ultrasonic Measurements of Surface Roughness"," in Surface Roughness and Scattering, Technical Digest Series (Optica Publishing Group, 1992), paper STuB1.

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Abstract

We describe the use of pulsed ultrasound at MHz carrier frequencies to reflect and scatter from rough surfaces in an analogous way that light is used, comparing the results to stylus data. A principal application is to the manufacturing environment for on-line real-time sensor feedback and process control.

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