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Effects of walk-off parameter and free-carrier dispersion on XPM-induced MI in SOI Nanowaveguides with higher order dispersion parameter

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Abstract

The impact of the walk-off parameter and free-carrier dispersion on the modulation instability (MI) due to cross-phase-modulation (XPM) in a silicon-on-insulator (SOI) nanowaveguide is studied numerically in the normal-anomalous dispersion regime.

© 2016 Optical Society of America

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