Imaging interferometric microscopy

Yuliya Kuznetsova; Alexander Neumann; S. R. J. Brueck

Conference on Lasers and Electro-Optics/International Quantum Electronics Conference and Photonic Applications Systems Technologies
Technical Digest (CD) (Optica Publishing Group, 2004),
paper PThA5

Imaging interferometric microscopy

Yuliya Kuznetsova, Alexander Neumann, and S. R. J. Brueck

Photonic Applications Systems Technologies Conference 2004

San Francisco, California United States
ISBN: 1-55752-770-9

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Lasers in Manufacturing V (PThA)

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Y. Kuznetsova, A. Neumann, and S. R. J. Brueck, "Imaging interferometric microscopy," in Conference on Lasers and Electro-Optics/International Quantum Electronics Conference and Photonic Applications Systems Technologies, Technical Digest (CD) (Optica Publishing Group, 2004), paper PThA5.

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Abstract

Demonstration of imaging interferometric microscopy (IIM). Combining multiple off-axis exposures with interferometric restoration of the zero-order beam, IIM provides high resolution at advantages of low numerical aperture. Image reconstruction and comparison with Fourier optics model.

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