Imaging Interferometric Microscopy

Ch. J. Schwarz; Y. Kuznetsova; S.R.J. Brueck

Conference on Lasers and Electro-Optics
OSA Technical Digest (Optica Publishing Group, 2002),
paper CMG1

Imaging Interferometric Microscopy

Ch. J. Schwarz, Y. Kuznetsova, and S.R.J. Brueck

Conference on Lasers and Electro-Optics 2002

Long Beach, California United States
19–22 May 2002
ISBN: 1-55752-706-7

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Optical Instrumentation and Measurements (CMG)

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C. J. Schwarz, Y. Kuznetsova, and S. R. J. Brueck, "Imaging Interferometric Microscopy," in Conference on Lasers and Electro-Optics, M. Fejer, F. Leonberger, J. Fujimoto, and S. Newton, eds., OSA Technical Digest (Optica Publishing Group, 2002), paper CMG1.

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Abstract

In order to achieve the resolution of a high-NA objective while retaining the field-of-view and the depth-of-focus and the working distance of a low- NA objective, we introduce the concept of imaging interferometric microscopy.

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