Materials Parameters of Photorefractive Crystals from Anisotropic Diffraction Measurements

D. A. Temple; R. S. Hathcock; C. Warde

doi:10.1364/PRM.1987.ThB5

Topical Meeting on Photorefractive Materials, Effects, and Devices
Technical Digest Series (Optica Publishing Group, 1987),
paper ThB5
•https://doi.org/10.1364/PRM.1987.ThB5

Materials Parameters of Photorefractive Crystals from Anisotropic Diffraction Measurements

D. A. Temple, R. S. Hathcock, and C. Warde

Photorefractive Materials 1987

Los Angeles, California United States
12–14 August 1987
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Scattering Effects (ThB)

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D. A. Temple, R. S. Hathcock, and C. Warde, "Materials Parameters of Photorefractive Crystals from Anisotropic Diffraction Measurements," in Topical Meeting on Photorefractive Materials, Effects, and Devices, Technical Digest Series (Optica Publishing Group, 1987), paper ThB5.

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Abstract

Anisotropic gratings in BaTiO₃ are used to determine electrooptic coefficient ratios, quantum efficiency, diffusion lengths, and the a to c axis ratios of the mobilities and dielectric constants.

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