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Conferences > OIC > 1992 > OThD > OThD10

Anisotropy in thin films: modelization and measurement of guided and non guided optical properties. Application to TiO2 films

F. Flory, D. Endelema, E. Pelletier, and I. Hodgkinson

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Abstract

The main purpose of the work presented here is to study the anisotropic behavior of dielectric material in thin film form.

© 1992 Optical Society of America

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