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Today, non-quaterwave optical coatings are commonly used in production, especially due to the rapid development of CAD technique. The wideband monitoring method, proposed by B. Vidal, A. Fornier and E. Pelletier [1] in 1978, is very effective to solve the monitoring problem of this kind of coatings. A practical wideband monitoring system has been established in our laboratory.
© 1988 Optical Society of America
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