New Interferogram Analysis Procedure Based On Optimisation

F. Guse; J. Kross

doi:10.1364/OFT.1994.OWA3

Optical Fabrication and Testing Workshop
Technical Digest Series (Optica Publishing Group, 1994),
paper OWA3
•https://doi.org/10.1364/OFT.1994.OWA3

New Interferogram Analysis Procedure Based On Optimisation

F. Guse and J. Kross

Optical Fabrication and Testing 1994

Rochester, New York United States
6–9 June 1994
ISBN:

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Instrumentation and Analysis (OWA)

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F. Guse and J. Kross, "New Interferogram Analysis Procedure Based On Optimisation," in Optical Fabrication and Testing Workshop, Technical Digest Series (Optica Publishing Group, 1994), paper OWA3.

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Abstract

For the quantitative analysis of interferograms being of Michelson- or Fizeau-type, fringe pattern analysis or phase-shifting techniques are commonly applied. With fringe pattern analysis, a wavefront is evaluated from only one interferogram, but the "permitted" interferograms are restricted to open fringes. The phase-shifting technique allows the analysis of a greater variety of interferograms, but requires a correlation of three or more measurements.

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