Author Affiliations

Qiao Gao,^a Bin Liu,^a,* Yingying Hu,^a Juan Liu,^a Shengpeng Wan,^a Tao Wu,^a Xing-Dao He,^a Jinhui Yuan,^c,* Zabih Ghassemlooy,^c Gerald Farrell,^d and Qiang Wu^a,b,*

^aKey Laboratory of Nondestructive Test (Ministry of Education), Nanchang Hangkong University, Nanchang 330063, China

^bFaculty of Engineering and Environment, Northumbria University, Newcastle Upon Tyne, NE1 8ST, United Kingdom

^cState Key Laboratory of Information Photonics and Optical Commun, Beijing University of Posts and Telecommunications, Beijing 100876, China

^dPhotonics Research Centre, School of Electrical and Electronic Engineering, City Campus, Technological University Dublin, Dublin 7, Ireland

^*Corresponding author: qiang.wu@northumbria.ac.uk, liubin@nchu.edu.cn, yuanjinhui81@bupt.edu.cn