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Metamaterial waveguides with low distributed backscattering in production O-band Si photonics

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Abstract

We report on the first measurement of distributed backscattering in metamaterial (subwavelength grating) waveguides. We find distributed backscattering to be < -50 dB/mm in samples fabricated using a CMOS-integrated Si photonic production process.

© 2017 Optical Society of America

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