Picosecond Time Resolved Emission of Mercury Cadmium Telluride and Related II - VI Semiconductor Crystals

J. Andrew Hutchinson; T.E. Dutton; P.M. Rentzepis; Donald E. Cooper; J. Bajaj; P.R. Newman

doi:10.1364/LMD.1987.ThE3

Topical Meeting on Lasers in Materials Diagnostics
Technical Digest Series (Optica Publishing Group, 1987),
paper ThE3
•https://doi.org/10.1364/LMD.1987.ThE3

Picosecond Time Resolved Emission of Mercury Cadmium Telluride and Related II - VI Semiconductor Crystals

J. Andrew Hutchinson, T.E. Dutton, P.M. Rentzepis, Donald E. Cooper, J. Bajaj, and P.R. Newman

Lasers in Material Diagnostics 1987

Albuquerque, New Mexico United States
11–12 February 1987
ISBN:

From the session
Optical Diagnostics of Semiconductors-Photoluminescence (ThE)

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J. A. Hutchinson, T. E. Dutton, P. M. Rentzepis, D. E. Cooper, J. Bajaj, and P. R. Newman, "Picosecond Time Resolved Emission of Mercury Cadmium Telluride and Related II - VI Semiconductor Crystals," in Topical Meeting on Lasers in Materials Diagnostics, Technical Digest Series (Optica Publishing Group, 1987), paper ThE3.

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Abstract

Picosecond resolved emission of HgCdTe and CdTe crystals by IR-VIS streak camera shows temperature dependent multiexponential decay kinetics and elucidates the mechanisms of exciton trapping and anihilation.

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