Abstract

Tip-enhanced Raman scattering (TERS) microscopy is one of the powerful scanning probe microscopy, which enables Raman analysis at nanoscale beyond the diffraction limit of light [1]. Applications by using TERS microscopy to a variety of samples, such as carbon materials, semiconductors and bio-molecules, have been reported. Typically, the distance between the metal tip and samples are con-trolled by contact-mode atomic force microscopy (AFM) to obtain the sufficient Raman enhancement in a moderate exposure time. However, the contact-mode AFM can limit the range of applications. It is difficult to measure samples which are soft or unfixed on a glass substrate, because the tip can damage or drag the sample. Moreover, a laser beam which is used to detect a cantilever deflection can interfere with Raman measurements in visible wavelengths. We believe that the introduction of advanced AFMs can expand the applications and contribute to commercialization.

© 2017 Japan Society of Applied Physics, Optical Society of America