Abstract

We investigated the effect of an intense dressing field on the energies of electrons ejected in an Auger process by means of electron spectroscopy. An amplified Ti:S laser provides infrared (800 nm) pulses of 40 mJ ranging from 150 femtoseconds to 8 picoseconds.^[1] Part of the infrared beam is focused onto a liquid metal (gallium) target to produce broadband X-radiation. Auger electrons resulting from the X-induced LMM transition in argon^[2] are detected in a time-of-flight electron spectrometer. When the X-ray beam and the infrared dressing beam overlap in space and time, sidebands appear around the Auger peaks, corresponding to absorption or emission of photons from the dressing field.

© 1994 Optical Society of America