Abstract
A robust all-linear method based on spectral interferometry for measuring the carrier-envelope offset phase of ultrashort laser pulses is demonstrated. The performance has been proved with cross-calibration with a conventional f-to-2f interferometer.
© 2011 Optical Society of America
PDF ArticleMore Like This
P. Jójárt, Á. Börzsönyi, S. Koke, M. Görbe, and K. Osvay
CWI6 CLEO: Science and Innovations (CLEO:S&I) 2011
Karoly Osvay, Mihaly Görbe, Christian Grebing, and Günter Steinmeyer
CThU6 Conference on Lasers and Electro-Optics (CLEO:S&I) 2008
Olivier Gobert, Pierre-Mary Paul, Jean-François Hergott, Olivier Tcherbakoff, Fabien Lepetit, François Viala, and Michel Comte
CF_P11 The European Conference on Lasers and Electro-Optics (CLEO/Europe) 2011