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  • Conference on Lasers and Electro-Optics/Quantum Electronics and Laser Science Conference and Photonic Applications Systems Technologies
  • OSA Technical Digest (CD) (Optica Publishing Group, 2008),
  • paper CThU6

A linear optical method for measuring the carrier envelope offset phase

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Abstract

A linear optical method is demonstrated for extracting the carrier-envelope offset phase via the fringe visibility in a combined two-path multi-path interferometer. This method is applicable to a wider class of lasers than f-to-2f interferometry.

© 2008 Optical Society of America

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