Abstract

We present quantitative measurements of mechanical forces induced by evanescent light on a semiconductor probe tip via the surface photovoltage effect (SPV).¹ The semiconducting tip is used as a sensitive sub-wavelength sized light detector. Scanning techniques allow the profiling of laterally inhomogeneous light distributions such as a standing wave pattern. A combination with the "local charge force microscopy" provides simultaneous information on local charge distributions on the surface.²

© 1994 IEEE