Abstract
Optical sectioning technologies achieve high precision localization by reducing the background photon count. We use tilted light-sheet microscopy to achieve optical sectioning in localization microscopy, enabling thick sample observation and low background photon count images. A deformable mirror was incorporated to generate a tetrapod point spread function (PSF), enabling high resolution 3D localization. DNA-PAINT was imaged with 15 nm transverse and 60 nm axial resolution.
© 2021 The Author(s)
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