Wide-field, high-resolution reflection-mode Fourier ptychographic microscopy

Hao Wang; Jiabei Zhu; Jangwoon Sung; Guorong Hu; Joseph Greene; Yunzhe Li; Seungbeom Park; Wookrae Kim; Myungjun Lee; Yusin Yang; Lei Tian; Lei Tian

doi:10.1364/DH.2023.HW3C.2

Optica Imaging Congress (3D, COSI, DH, FLatOptics, IS, pcAOP)
Technical Digest Series (Optica Publishing Group, 2023),
paper HW3C.2
•https://doi.org/10.1364/DH.2023.HW3C.2

Wide-field, high-resolution reflection-mode Fourier ptychographic microscopy

Hao Wang, Jiabei Zhu, Jangwoon Sung, Guorong Hu, Joseph Greene, Yunzhe Li, Seungbeom Park, Wookrae Kim, Myungjun Lee, Yusin Yang, and Lei Tian

Digital Holography and Three-Dimensional Imaging 2023

Boston, Massachusetts United States
14–17 August 2023
ISBN: 978-1-957171-28-9

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Phase Processing, Retrieval Techniques, and Applications III (HW3C)

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H. Wang, J. Zhu, J. Sung, G. Hu, J. Greene, Y. Li, S. Park, W. Kim, M. Lee, Y. Yang, and L. Tian, "Wide-field, high-resolution reflection-mode Fourier ptychographic microscopy," in Optica Imaging Congress (3D, COSI, DH, FLatOptics, IS, pcAOP), Technical Digest Series (Optica Publishing Group, 2023), paper HW3C.2.

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Abstract

We demonstrate a novel topography technique based on the reflection-mode Fourier ptychographic microscopy, termed Fourier ptychograhpic topography (FPT), to provide a wide field-of-view, high resolution, and nanoscale topography reconstruction accuracy.

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