Abstract

This full-field three-dimensional (3D) optical microscope is based on the reflectivity-height transformation. Using a parallelogram prism and two CCDs to detect the reflectivity at the critical angle nearby can achieve the angle deviation and surface height.

© 2014 Optical Society of America

PDF Article
This paper was not presented at the conference

More Like This
Full-field Transmission-type Angle-deviation Optical Microscope with Reflectivity-Height Transformation

Ming-Hung Chiu, Chen-Tai Tan, Ming-Hung Tsai, and Ya-Hsin Yang
JT3A.8 Bio-Optics: Design and Application (BODA) 2015

10-meter Remote Measurements by Use of a 3-D Telescope

Ming-Hung Chiu and Yan-Sin Chen
WPF_23 Conference on Lasers and Electro-Optics/Pacific Rim (CLEOPR) 2013

Wide-field diffraction phase microscope for precision metrology

Gannavarpu Rajshekhar, Basanta Bhaduri, Chris Edwards, Renjie Zhou, Lynford L. Goddard, and Gabriel Popescu
DTh1B.2 Digital Holography and Three-Dimensional Imaging (DH) 2014

References

You do not have subscription access to this journal. Citation lists with outbound citation links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access OSA Member Subscription