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Nonlinear Multimodal Microscope with Increased Axial Resolution Using Interferometric Backwards Third Harmonic Generation

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Abstract

A new nonlinear optical microscope based on interference of multiple reflected third harmonic waves is presented. The signal can be used to infer surface height variations with up to 5 nm accuracy. We demonstrate the technique by imaging fibroblasts.

© 2014 Optical Society of America

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