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Conferences > CLEO_SI > 2022 > SS1A > SS1A.2

Dynamic Measurements at up to 130-kHz Sampling Rates Using Ti:sapphire Dual-Comb Distance Metrology

Toby Mitchell, Jinghua Sun, and Derryck T. Reid

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Abstract

By using band-limited detection we demonstrate Ti:sapphire dual-comb distance metrology at >100 kHz, providing few-nm precision in 100 ms with a non-ambiguity range of 29 cm. Exemplar dynamic measurements of audio waveforms are presented.

© 2022 The Author(s)

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