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Carrier-Free Dual-Comb Distance Metrology Using Two-Photon Detection

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Abstract

By using cross-polarized dual combs and two-photon detection we demonstrate carrier- phase-insensitive time-of-flight distance measurement at 1555 nm with 93 nm precision and sampling rates exceeding by 2.4′ the conventional dual-comb metrology aliasing limit.

© 2021 The Author(s)

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