Abstract
Label free sensing applications based on refractive index (RI) require new encapsulated high Q-factor cavity designs, that can overcome the inaccuracies inherent in the fabrication process. The required fine tuning of the current RI sensors based on PhCNC makes them highly sensitive to disparities found in the fabrication. These imperfections can dramatically decrease the performance, in designs which possess strict features along the whole design parameters space [5], against different nanopillar widths Wx in two extreme shape cases: rectangular and elliptical ones.
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