Abstract
The technique is based on the interface specific generation of second-harmonic (SH) light if the sample is illuminated with high laser intensities. The SH light is used to create a magnified image of the interface structure on the target of an electronic low light-level camera. The response of the camera is calibrated. Hence, the second-order optical susceptibility tensor of any structure resolved in the images can be measured.
© 1996 IEEE
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