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Conferences > CLEO_Europe > 1996 > CMI > CMI2

Optically levitated stylus for scanning force microscopy

M. E. J. Friese, H. Rubinsztein-Dunlop, and N. R. Heckenberg

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Abstract

A single-beam optical gradient trap could potentially be used to hold a stylus for scanning force microscopy1. An optically trapped particle can be modelled as a harmonic oscillator and can thus be characterised by its spring constant. We have determined the spring constants for particles trapped in both Gaussian and donut beams2, using a novel technique of measurement of the backscattered light.

© 1996 IEEE

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