Abstract
Until recently, investigations of the surface and bulk defects in silica glass have developed virtually independent. Only in [1,2] some properties of the surface and bulk defects in vitreous silica were compared. Identification of the structure of defects in the bulk of silica glass is a considerably more complicated problem. This is explained by a wide variety of methods, which can be used to identify the structure of surface defects and reveal the mechanisms of their transformations under the action of different external factors (temperature, UV and γ-irradiation, reactions with different impurity molecules, the so-called technological impurities, etc.).
© 1997 Optical Society of America
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