November 2022
Spotlight Summary by Guangyuan Li
Optical phased array with on-chip phase calibration
Optical phased array (OPA) is an emerging technology that enables exciting applications such as light detection and ranging (LiDAR) and light fidelity (Li-Fi). However, before robust and accurate beam steering can be obtained, phase calibration should be performed in order to compensate the small but fatal phase errors that are induced by inevitable fabrication imperfections. Conventionally, this was done using iterative optimization algorithms, which are computationally complex, and an external optical setup, which requires frequent re-calibration.
To overcome these drawbacks, Prost et al. demonstrate an on-chip integrated phase calibration system that enables in-situ and real-time phase error monitoring and correction with linear scalability and low computational complexity. This system is composed of compact phase interrogator structures and readout photodiodes that are implemented within the OPA architecture. The calibrated OPA exhibits impressive beaming performance. The authors further extended the system to tackle the wavelength dependence, and demonstrated calibrated full 2D beam steering and arbitrary pattern generation.
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To overcome these drawbacks, Prost et al. demonstrate an on-chip integrated phase calibration system that enables in-situ and real-time phase error monitoring and correction with linear scalability and low computational complexity. This system is composed of compact phase interrogator structures and readout photodiodes that are implemented within the OPA architecture. The calibrated OPA exhibits impressive beaming performance. The authors further extended the system to tackle the wavelength dependence, and demonstrated calibrated full 2D beam steering and arbitrary pattern generation.
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Article Information
Optical phased array with on-chip phase calibration
Mathias Prost, Jon Øyvind Kjellman, Sarvagya Dwivedi, Aleksandrs Marinins, Hemant Kumar Tyagi, Tangla David Kongnyuy, Philippe Soussan, Marcus S. Dahlem, Xavier Rottenberg, and Roelof Jansen
Opt. Lett. 47(23) 6081-6084 (2022) View: Abstract | HTML | PDF