Abstract
We report on tellurium-oxide ()-coated silicon nitride microring resonators with internal quality factors up to , corresponding to 0.5 dB/cm waveguide loss, at wavelengths around 1550 nm. The microring resonators are fabricated using a silicon nitride foundry process followed by coating deposition in a single post-processing step. The silicon nitride strip height of 0.2 μm enables a small microring bending radius, while the coating thickness of 0.33 μm results in a large modal overlap with the layer. These results are a promising step towards realizing compact and high-performance linear, nonlinear, and rare-earth-doped active integrated photonic devices with this platform.
© 2018 Optical Society of America
Full Article | PDF ArticleMore Like This
Khadijeh Miarabbas Kiani, Hamidu M. Mbonde, Henry C. Frankis, Richard Mateman, Arne Leinse, Andrew P. Knights, and Jonathan D. B. Bradley
OSA Continuum 3(12) 3497-3507 (2020)
Khadijeh Miarabbas Kiani, Henry C. Frankis, Hamidu M. Mbonde, Richard Mateman, Arne Leinse, Andrew P. Knights, and Jonathan D. B. Bradley
Opt. Lett. 44(23) 5788-5791 (2019)
Henry C. Frankis, Khadijeh Miarabbas Kiani, Dawson B. Bonneville, Chenglin Zhang, Samuel Norris, Richard Mateman, Arne Leinse, Nabil D. Bassim, Andrew P. Knights, and Jonathan D. B. Bradley
Opt. Express 27(9) 12529-12540 (2019)