Abstract

We introduce a novel ghost reflection ellipsometer for a spectral characterization of homogeneous thin films and interfaces. The device makes use of a uniform, spatially incoherent, unpolarized light source with Gaussian statistics and of the detection of intensity correlations. Unlike traditional ellipsometers, no source or detector calibration and reference sample are needed. The method is also insensitive to instrumentation errors. The ellipsometer that we present here is a classical analog of a quantum twin-photon arrangement discussed earlier in the literature. However, the classical configuration is easier to implement and use, because entangled photon pairs are not needed and appropriate light sources and detectors are readily available.

© 2016 Optical Society of America

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